Careers · Touchdown Foundry

Yield, Reliability & Failure Analysis Engineer

Trace yield loss and reliability failures to measured mechanisms, then verify corrective action against a baseline.

Current stage: Foundry engineering. First process, site, work location, compensation, and start date are still being defined. Physical work requires qualified facilities and approval.


Open role

Yield, Reliability & Failure Analysis Engineer

Why this work matters

Touchdown is engineering modular manufacturing for the chips and memory systems future computing needs. This role helps turn a buyer's physical result into a qualified process or a defensible decision to use an existing supplier. Advanced packaging is our intended first fab class; no production fab is operating today.

Overview

You will connect lot genealogy, electrical results, physical inspection, and accelerated stress data to explain why parts fail. The work starts with a defined product and a baseline. You will plan controlled splits, challenge competing causes, and bring the result to an independent reviewer before a process or product disposition changes.

What you will own

  • Turn defects, reliability failures, and field returns into bounded root-cause hypotheses and corrective actions.
  • Build a defect and yield baseline by lot, process step, tool, material, and package design.
  • Plan reliability stresses from customer conditions and identify valid failure mechanisms.
  • Run failure analysis with documented hypotheses, controls, corrective action, and verification.
  • Set a failure-analysis decision tree that names samples, destructive steps, controls, and the evidence needed to stop an investigation.
  • Review corrective actions for new failure modes, cost, throughput, and customer acceptance before recommending a route change.

Technical territory

Defect paretos, wafer and package maps, SPC, DOE, sample size, confidence limits, stress conditions, FA methods, electrical localization, material and cross-section analysis, CAPA, and qualification handoff.

Representative outputs

  • A baseline defect/yield map and controlled split plan with a named independent checker.
  • A Pareto and genealogy-linked defect map with confidence limits.
  • A reliability matrix and corrective-action record with verification criteria.
  • A root-cause review that separates observation, hypothesis, test result, remaining uncertainty, and release decision.

What success looks like

  • The team can say which failure mode changed and why.
  • A corrective action improves accepted-good yield or reliability against a baseline.
  • An independent checker can reproduce the analysis and challenge the chosen failure mechanism.
  • The corrected route improves the agreed customer outcome without moving the failure elsewhere.

What you bring

  • Yield analysis, failure analysis, accelerated reliability, DOE/SPC, and cross-functional disposition.
  • Led yield, reliability, or failure-analysis work on semiconductor products.
  • Can use DOE and SPC without confusing correlation with root cause.
  • Can coordinate physical, electrical, and material analysis with independent reviewers.
  • Can design informative experiments from scarce samples and distinguish measurement variation from product variation.
  • Can communicate a stop, rework, reject, or further-test recommendation with its uncertainty.

Helpful experience

  • JEDEC-style qualification practice
  • Cross-section, SEM/EDX, or destructive analysis
  • Package and interconnect failure mechanisms
  • Field-return investigation
  • Thermal and mechanical stress modeling

How the role works

  • Applications are open; the exact work location, arrangement, compensation, and start date will be discussed during hiring.
  • Early work can produce engineering plans and partner comparisons. Hands-on work begins only at qualified, authorized facilities.
  • You will work with process, equipment, quality, test, customer, and supplier owners as the scope requires.

Show a real process, tool, workpiece, or product decision you owned, the measurements behind it, and what another team could reproduce.